FIB Nanostructures /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Wang, Zhiming M. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Lecture Notes in Nanoscale Science and Technology, 20
Materias:
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020 |a 9783319028743 
024 7 |a 10.1007/978-3-319-02874-3  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
245 1 0 |a FIB Nanostructures /  |c edited by Zhiming M. Wang. 
250 |a 1st ed. 2013. 
260 # # |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2013. 
300 |a XIII, 530 p. 375 illus., 200 illus. in color. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Lecture Notes in Nanoscale Science and Technology,  |v 20 
505 0 |a Preface -- Chapter 1: Focused Ion Beam (FIB) technology for micro and nanoscale fabrications -- Chapter 2: Epitaxial ferroelectric nanostructures fabricated by FIB milling -- Chapter 3: Low current focused-ion-beam milling for freestanding nanomaterial characterization -- Chapter 4: Focused ion beam milling of carbon nanotube yarns and Bucky-papers: Correlating their internal structure with their macro-properties -- Chapter 5: Nanoscale electrical contacts grown by Focused-Ion-Beam (FIB) Induced Deposition -- Chapter 6: Metal induced crystallization of focused ion beam induced deposition for functional patterned ultrathin nanocarbon -- Chapter 7: Deterministic Fabrication of Micro- and Nano-Structures by Focused Ion Beam -- Chapter 8: Application of ion beam processes to scanning probe microscopy -- Chapter 9: Fabrication of needle-shaped specimens containing sub-surface nanostructures for Electron Tomography -- Chapter 10: Fabrication technique of deformation carriers (gratings and speckle patterns) with FIB for micro/nano-scale deformation measurement -- Chapter 11: Controlled Quantum Dot Formation on Focused Ion Beam patterned GaAs Substrates -- Chapter 12: Development of Functional Metallic Glassy Materials by FIB and Nano-imprint Technologies -- Chapter 13: Nanostructured Materials Driven by Dielectrophoresis on Nanoelectrods Patterned by Focused Ion Beam -- Chapter 14: Focused Ion Beam Assisted Nano-Scale Processing and Thermoelectrical Characterization -- Chapter 15: FIB design for Nanofluidic applications -- Chapter 16: FIB Patterning of Stainless Steel for the Development of Nano-Structured Stent Surfaces for Cardiovascular Applications -- Chapter 17: Evaluation of damages induced by Ga+ focused ion beam in piezoelectric nanostructures -- Chapter 18: Instabilities in Focused Ion Beam-patterned nanostructures -- Chapter 19: Nanostructures by mass-separated FIB -- Index. 
650 0 |a Nanotechnology. 
650 0 |a Semiconductors. 
650 0 |a Nanochemistry. 
650 0 |a Nanoscale science. 
650 0 |a Nanoscience. 
650 0 |a Nanostructures. 
650 0 |a Optical materials. 
650 0 |a Electronic materials. 
650 1 4 |a Nanotechnology. 
650 2 4 |a Semiconductors. 
650 2 4 |a Nanotechnology and Microengineering. 
650 2 4 |a Nanochemistry. 
650 2 4 |a Nanoscale Science and Technology. 
650 2 4 |a Optical and Electronic Materials. 
700 1 |a Wang, Zhiming M.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks