Efficient Test Methodologies for High-Speed Serial Links /

Detalles Bibliográficos
Autores principales: Hong, Dongwoo. (Autor), Cheng, Kwang-Ting. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Lecture Notes in Electrical Engineering, 51
Materias:
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100 1 |a Hong, Dongwoo.  |e author. 
245 1 0 |a Efficient Test Methodologies for High-Speed Serial Links /  |c by Dongwoo Hong, Kwang-Ting Cheng. 
250 |a 1st ed. 2010. 
260 # # |a Dordrecht :  |b Springer Netherlands :  |b Imprint: Springer,  |c 2010. 
300 |a XII, 98 p. :  |b online resource. 
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490 1 |a Lecture Notes in Electrical Engineering,  |v 51 
505 0 |a An Efficient Jitter Measurement Technique -- BER Estimation for Linear Clock and Data Recovery Circuit -- BER Estimation for Non-linear Clock and Data Recovery Circuit -- Gaps in Timing Margining Test -- An Accurate Jitter Estimation Technique -- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers -- Conclusions. 
650 0 |a Computer engineering. 
650 0 |a Electronic circuits. 
650 0 |a Microprocessors. 
650 1 4 |a Computer Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Register-Transfer-Level Implementation. 
700 1 |a Cheng, Kwang-Ting.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks