Export Ready — 

Efficient Test Methodologies for High-Speed Serial Links /

Bibliographic Details
Main Authors: Hong, Dongwoo. (Author), Cheng, Kwang-Ting. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Lecture Notes in Electrical Engineering, 51
Subjects:
Table of Contents:
  • An Efficient Jitter Measurement Technique
  • BER Estimation for Linear Clock and Data Recovery Circuit
  • BER Estimation for Non-linear Clock and Data Recovery Circuit
  • Gaps in Timing Margining Test
  • An Accurate Jitter Estimation Technique
  • A Two-Tone Test Method for Continuous-Time Adaptive Equalizers
  • Conclusions.