Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials /

Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials /

Detalles Bibliográficos
Autores principales: Breitenstein, Otwin. (Autor), Warta, Wilhelm. (Autor), Langenkamp, Martin. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edición:2nd ed. 2010.
Colección:Springer Series in Advanced Microelectronics, 10
Materias:
Lasers.
Photonics.
Materials science.
Engineering.
Structural materials.
Optics, Lasers, Photonics, Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.
Tabla de Contenidos:
  • Introduction
  • Physical and Technical Basics
  • Timing Strategies
  • Heat Dissipation Mechanisms in Solar Cells
  • Carrier Density Imaging
  • Illuminated Lock-in Thermography (ILIT)
  • Experimental Technique
  • Theory
  • Measurement Strategies
  • Typical Applications
  • Summary and Outlook.

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