Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials /

Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials /

Bibliographic Details
Main Authors: Breitenstein, Otwin. (Author), Warta, Wilhelm. (Author), Langenkamp, Martin. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edition:2nd ed. 2010.
Series:Springer Series in Advanced Microelectronics, 10
Subjects:
Lasers.
Photonics.
Materials science.
Engineering.
Structural materials.
Optics, Lasers, Photonics, Optical Devices.
Characterization and Evaluation of Materials.
Engineering, general.
Structural Materials.

Sistema de Bibliotecas del Tecnológico de Costa Rica

Holdings details from Sistema de Bibliotecas del Tecnológico de Costa Rica
Copy Available

Similar Items