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02125nam a22004455i 4500 |
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131207s2013 xxu| s |||| 0|eng d |
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|a 9781461487210
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| 024 |
7 |
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|a 10.1007/978-1-4614-8721-0
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Larson, David J.
|e author.
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|a Local Electrode Atom Probe Tomography :
|b A User's Guide /
|c by David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly.
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| 250 |
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|a 1st ed. 2013.
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| 260 |
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|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2013.
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| 300 |
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|a XVII, 318 p. 164 illus., 54 illus. in color. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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0 |
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|a Preface -- Acknowledgements -- Foreword -- Abbreviations -- Chapter 1. History of APT and LEAP -- Chapter 2. Specimen Preparation -- Chapter 3. Design & Instrumentation -- Chapter 4. Data Collection -- Chapter 5. Data Processing and Reconstruction -- Chapter 6. Selected Analysis Topics -- Chapter 7. Applications of the Local Electrode Atom Probe -- Appendix A. Data File Formats -- Appendix B. Field Evaporation -- Appendix C. Reconstruction Geometry -- Appendix D. Mass Spectral Performance -- Appendix E. Additional Considerations for LEAP Operation -- Glossary -- Index.
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| 650 |
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|a Materials science.
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| 650 |
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|a Nanoscale science.
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| 650 |
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|a Nanoscience.
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| 650 |
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|a Nanostructures.
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| 650 |
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|a Nanochemistry.
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| 650 |
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|a Spectroscopy.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Nanotechnology.
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| 650 |
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4 |
|a Characterization and Evaluation of Materials.
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| 650 |
2 |
4 |
|a Nanoscale Science and Technology.
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| 650 |
2 |
4 |
|a Nanochemistry.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Nanotechnology.
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| 700 |
1 |
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|a Prosa, Ty J.
|e author.
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| 700 |
1 |
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|a Ulfig, Robert M.
|e author.
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| 700 |
1 |
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|a Geiser, Brian P.
|e author.
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| 700 |
1 |
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|a Kelly, Thomas F.
|e author.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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