Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis /

Detalles Bibliográficos
Autor principal: Echlin, Patrick. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Materias:
Tabla de Contenidos:
  • Sample Collection and Selection
  • Sample Preparation Tools
  • Sample Support
  • Sample Embedding ?and Mounting
  • Sample Exposure
  • Sample Dehydration
  • Sample Stabilization for Imaging in the SEM
  • Sample Stabilization to Preserve Chemical Identity
  • Sample Cleaning
  • Sample Surface Charge Elimination
  • Sample Artifacts and Damage
  • Additional Sources of Information.