Export Ready — 

Quantifying and Exploring the Gap Between FPGAs and ASICs /

Bibliographic Details
Main Authors: Kuon, Ian. (Author), Rose, Jonathan. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Subjects:
Table of Contents:
  • Background
  • Measuring the Gap
  • Automated Transistor Sizing for FPGAs
  • Navigating the Gap Using Architecture and Process Technology Scaling
  • Navigating the Gap using Transistor Sizing
  • Conclusions and FutureWork.