Robust Computing with Nano-scale Devices : Progresses and Challenges /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Huang, Chao. (Editor)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Lecture Notes in Electrical Engineering, 58
Subjects:
Table of Contents:
  • Fault Tolerant Nanocomputing
  • Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
  • Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays
  • Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics
  • The Prospect and Challenges of CNFET Based Circuits: A Physical Insight
  • Computing with Nanowires: A Self Assembled Neuromorphic Architecture
  • Computational Opportunities and CAD for Nanotechnologies.