Robust Computing with Nano-scale Devices : Progresses and Challenges /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Huang, Chao. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Lecture Notes in Electrical Engineering, 58
Materias:
Tabla de Contenidos:
  • Fault Tolerant Nanocomputing
  • Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics
  • Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays
  • Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics
  • The Prospect and Challenges of CNFET Based Circuits: A Physical Insight
  • Computing with Nanowires: A Self Assembled Neuromorphic Architecture
  • Computational Opportunities and CAD for Nanotechnologies.