Cita APA

SpringerLink (Online service), Kaushik, B. K., Dasgupta, S., & Singh, V. (2017). VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (1st ed. 2017.). Singapore: Springer Singapore : Imprint: Springer.

Citación estilo Chicago

SpringerLink (Online service), Brajesh Kumar Kaushik, Sudeb Dasgupta, y Virendra Singh. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. 1st ed. 2017. Singapore: Springer Singapore : Imprint: Springer, 2017.

Cita MLA

SpringerLink (Online service), Brajesh Kumar Kaushik, Sudeb Dasgupta, y Virendra Singh. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers. 1st ed. 2017. Singapore: Springer Singapore : Imprint: Springer, 2017.