VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /
| Autor Corporativo: | |
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| Otros Autores: | , , |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Singapore :
Springer Singapore : Imprint: Springer,
2017.
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| Edición: | 1st ed. 2017. |
| Colección: | Communications in Computer and Information Science,
711 |
| Materias: |
Sistema de Bibliotecas del TEC
| Copia | Disponible |
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