VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Kaushik, Brajesh Kumar. (Editor), Dasgupta, Sudeb. (Editor), Singh, Virendra. (Editor)
Format: eBook
Language:English
Published: Singapore : Springer Singapore : Imprint: Springer, 2017.
Edition:1st ed. 2017.
Series:Communications in Computer and Information Science, 711
Subjects:
Description
Physical Description:XXI, 815 p. 486 illus. : online resource.
ISBN:9789811074707