VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /

VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Kaushik, Brajesh Kumar. (Editor ), Dasgupta, Sudeb. (Editor ), Singh, Virendra. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Singapore : Springer Singapore : Imprint: Springer, 2017.
Edición:1st ed. 2017.
Colección:Communications in Computer and Information Science, 711
Materias:
Computer hardware.
Microprocessors.
Computer communication systems.
Computer Hardware.
Processor Architectures.
Computer Communication Networks.
Tabla de Contenidos:
  • Digital design
  • Analog/mixed signal
  • VLSI testing
  • Devices and technology
  • VLSI architectures
  • Emerging technologies and memory
  • System design
  • Low power design and test
  • RF circuits
  • Architecture and CAD
  • Design verification.

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