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171221s2017 si | s |||| 0|eng d |
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|a 9789811074707
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024 |
7 |
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|a 10.1007/978-981-10-7470-7
|2 doi
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040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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245 |
1 |
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|a VLSI Design and Test :
|b 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers /
|c edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.
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250 |
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|a 1st ed. 2017.
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260 |
# |
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|a Singapore :
|b Springer Singapore :
|b Imprint: Springer,
|c 2017.
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300 |
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|a XXI, 815 p. 486 illus. :
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Communications in Computer and Information Science,
|v 711
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505 |
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|a Digital design -- Analog/mixed signal -- VLSI testing -- Devices and technology -- VLSI architectures -- Emerging technologies and memory -- System design -- Low power design and test -- RF circuits -- Architecture and CAD -- Design verification.
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|a Computer hardware.
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|a Microprocessors.
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|a Computer communication systems.
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4 |
|a Computer Hardware.
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|a Processor Architectures.
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4 |
|a Computer Communication Networks.
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1 |
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|a Kaushik, Brajesh Kumar.
|e editor.
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1 |
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|a Dasgupta, Sudeb.
|e editor.
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700 |
1 |
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|a Singh, Virendra.
|e editor.
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710 |
2 |
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|a SpringerLink (Online service)
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773 |
0 |
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|t Springer eBooks
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