VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers /

VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Kaushik, Brajesh Kumar. (Editor ), Dasgupta, Sudeb. (Editor ), Singh, Virendra. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Singapore : Springer Singapore : Imprint: Springer, 2017.
Edición:1st ed. 2017.
Colección:Communications in Computer and Information Science, 711
Materias:
Computer hardware.
Microprocessors.
Computer communication systems.
Computer Hardware.
Processor Architectures.
Computer Communication Networks.

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