|
|
|
|
| LEADER |
01898nam a22003975i 4500 |
| 001 |
000294013 |
| 005 |
20211011155720.0 |
| 007 |
cr nn 008mamaa |
| 008 |
100715s2010 xxu| s |||| 0|eng d |
| 020 |
|
|
|a 9780387981826
|
| 024 |
7 |
|
|a 10.1007/978-0-387-98182-6
|2 doi
|
| 040 |
|
|
|a Sistema de Bibliotecas del Tecnológico de Costa Rica
|
| 100 |
1 |
|
|a Ayache, Jeanne.
|e author.
|
| 245 |
1 |
0 |
|a Sample Preparation Handbook for Transmission Electron Microscopy :
|b Methodology /
|c by Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.
|
| 250 |
|
|
|a 1st ed. 2010.
|
| 260 |
# |
# |
|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2010.
|
| 300 |
|
|
|a XXIII, 250 p. :
|b online resource.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 505 |
0 |
|
|a Methodology: General Introduction -- to Materials -- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) -- Materials Problems and Approaches for TEM and TEM/STEM Analyses -- Physical and Chemical Mechanisms of Preparation Techniques -- Artifacts in Transmission Electron Microscopy -- Selection of Preparation Techniques Based on Material Problems and TEM Analyses -- Comparisons of Techniques -- Conclusion: What Is a Good Sample?.
|
| 650 |
|
0 |
|a Materials science.
|
| 650 |
|
0 |
|a Microscopy.
|
| 650 |
|
0 |
|a Mineralogy.
|
| 650 |
|
0 |
|a Nanotechnology.
|
| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
|
| 650 |
2 |
4 |
|a Biological Microscopy.
|
| 650 |
2 |
4 |
|a Mineralogy.
|
| 650 |
2 |
4 |
|a Nanotechnology.
|
| 700 |
1 |
|
|a Beaunier, Luc.
|e author.
|
| 700 |
1 |
|
|a Boumendil, Jacqueline.
|e author.
|
| 700 |
1 |
|
|a Ehret, Gabrielle.
|e author.
|
| 700 |
1 |
|
|a Laub, Danièle.
|e author.
|
| 710 |
2 |
|
|a SpringerLink (Online service)
|
| 773 |
0 |
|
|t Springer eBooks
|
| 900 |
|
|
|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|