Sample Preparation Handbook for Transmission Electron Microscopy : Methodology /
| Main Authors: | , , , , |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer New York : Imprint: Springer,
2010.
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| Edition: | 1st ed. 2010. |
| Subjects: |
Table of Contents:
- Methodology: General Introduction
- to Materials
- The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)
- Materials Problems and Approaches for TEM and TEM/STEM Analyses
- Physical and Chemical Mechanisms of Preparation Techniques
- Artifacts in Transmission Electron Microscopy
- Selection of Preparation Techniques Based on Material Problems and TEM Analyses
- Comparisons of Techniques
- Conclusion: What Is a Good Sample?.