Silver Metallization : Stability and Reliability /

Silver Metallization : Stability and Reliability /

Detalles Bibliográficos
Autores principales: Adams, Daniel. (Autor), Alford, Terry L. (Autor), Mayer, James W. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: London : Springer London : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Engineering Materials and Processes,
Materias:
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Industrial engineering.
Production engineering.
Metals.
Materials—Surfaces.
Manufactures.
Surface and Interface Science, Thin Films.
Industrial and Production Engineering.
Metallic Materials.
Surfaces and Interfaces, Thin Films.
Manufacturing, Machines, Tools, Processes.
Tabla de Contenidos:
  • Silver Thin Film Characterization
  • Diffusion Barriers and Self-encapsulation
  • Thermal Stability
  • Silver Electromigration Resistance
  • Integration Issues
  • Summary.

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