Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook /
Autores principales: | Lyman, Charles E. (Autor), Newbury, Dale E. (Autor), Goldstein, Joseph. (Autor), Williams, David B. (Autor), Romig Jr., Alton D. (Autor), Armstrong, John. (Autor), Echlin, Patrick. (Autor), Fiori, Charles. (Autor), Joy, David C. (Autor), Lifshin, Eric. (Autor), Peters, Klaus-Rüdiger. (Autor) |
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Autor Corporativo: | SpringerLink (Online service) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
New York, NY :
Springer US : Imprint: Springer,
1990.
|
Edición: | 1st ed. 1990. |
Materias: |
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