Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : A Laboratory Workbook /

Detalles Bibliográficos
Autores principales: Lyman, Charles E. (Autor), Newbury, Dale E. (Autor), Goldstein, Joseph. (Autor), Williams, David B. (Autor), Romig Jr., Alton D. (Autor), Armstrong, John. (Autor), Echlin, Patrick. (Autor), Fiori, Charles. (Autor), Joy, David C. (Autor), Lifshin, Eric. (Autor), Peters, Klaus-Rüdiger. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 1990.
Edición:1st ed. 1990.
Materias:

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