Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis /

Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis /

Detalles Bibliográficos
Autor principal: Chen, Hsinchun. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Integrated Series in Information Systems, 20
Materias:
Nanotechnology.
Information technology.
Business-Data processing.
Data structures (Computer science).
Electrical engineering.
Database management.
Nanotechnology and Microengineering.
IT in Business.
Data Structures and Information Theory.
Electrical Engineering.
Database Management.
Acceso en línea:https://doi.org/10.1007/978-0-387-71620-6

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