Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis /
| Main Author: | |
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| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer US : Imprint: Springer,
2009.
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| Edition: | 1st ed. 2009. |
| Series: | Integrated Series in Information Systems,
20 |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/978-0-387-71620-6 |