Porous Semiconductors Optical Properties and Applications /

Detalles Bibliográficos
Autores principales: Kochergin, Vladimir. (Autor), Föll, Helmut. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: London : Springer London : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Engineering Materials and Processes,
Materias:
Acceso en línea:https://doi.org/10.1007/978-1-84882-578-9
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024 7 |a 10.1007/978-1-84882-578-9  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
100 1 |a Kochergin, Vladimir.  |e author. 
245 1 0 |a Porous Semiconductors  |b Optical Properties and Applications /  |c by Vladimir Kochergin, Helmut Föll. 
250 |a 1st ed. 2009. 
260 # # |a London :  |b Springer London :  |b Imprint: Springer,  |c 2009. 
300 |a IX, 209 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Engineering Materials and Processes, 
505 0 |a Pore Etching Essentials -- Subwavelength Approach of Light Propagation Through Porous Semiconductors -- Leaky Waveguide Approach of Light Propagation Through Porous Semiconductors -- Normal Waveguide Approach of Light Propagation Through Porous Semiconductors -- Optical Components from Mesoporous Silicon -- Long Wave Pass Filters -- Macroporous Silicon Ultraviolet Filters -- Polarization Components for the UV Range -- Retroreflection Suppression Plate -- Omnidirectional IR Filters -- Biochemical Sensors Based on Porous Silicon. 
650 0 |a Mechanics. 
650 0 |a Mechanics, Applied. 
650 0 |a Optical materials. 
650 0 |a Electronic materials. 
650 0 |a Lasers. 
650 0 |a Photonics. 
650 0 |a Microwaves. 
650 0 |a Optical engineering. 
650 1 4 |a Solid Mechanics. 
650 2 4 |a Optical and Electronic Materials. 
650 2 4 |a Optics, Lasers, Photonics, Optical Devices. 
650 2 4 |a Microwaves, RF and Optical Engineering. 
700 1 |a Föll, Helmut.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
856 4 0 |u https://doi.org/10.1007/978-1-84882-578-9