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01904nam a22004455i 4500 |
| 001 |
978-3-540-49829-2 |
| 005 |
20191021232214.0 |
| 007 |
cr nn 008mamaa |
| 008 |
100301s2009 gw | s |||| 0|eng d |
| 020 |
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|a 9783540498292
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| 024 |
7 |
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|a 10.1007/978-3-540-49829-2
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Holze, Rudolf.
|e author.
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| 245 |
1 |
0 |
|a Surface and Interface Analysis
|b An Electrochemists Toolbox /
|c by Rudolf Holze.
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| 250 |
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|a 1st ed. 2009.
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| 260 |
# |
# |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2009.
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| 300 |
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|a XXII, 300 p.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Springer Series in Chemical Physics,
|v 74
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| 505 |
0 |
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|a and Overview -- Structure and Dynamics of Electrochemical Phase Boundaries -- Scope and Limitations of Classical Electrochemical Methods -- Spectroscopy and Surface Analysis at Interfaces Between Condensed Phases -- Methods and Applications -- Spectroscopy at Electrochemical Interfaces -- Diffraction and Other X-Ray Methods -- Surface Analytical Methods.
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| 650 |
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0 |
|a Materials—Surfaces.
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| 650 |
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0 |
|a Thin films.
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| 650 |
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0 |
|a Physical measurements.
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| 650 |
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0 |
|a Measurement .
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| 650 |
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0 |
|a Solid state physics.
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| 650 |
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0 |
|a Spectroscopy.
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| 650 |
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0 |
|a Microscopy.
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| 650 |
|
0 |
|a Physical chemistry.
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| 650 |
|
0 |
|a Materials science.
|
| 650 |
1 |
4 |
|a Surfaces and Interfaces, Thin Films.
|
| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
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| 650 |
2 |
4 |
|a Solid State Physics.
|
| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Physical Chemistry.
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| 650 |
2 |
4 |
|a Characterization and Evaluation of Materials.
|
| 710 |
2 |
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|a SpringerLink (Online service)
|
| 773 |
0 |
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|t Springer eBooks
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| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-540-49829-2
|