Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Bibliographic Details
Main Authors: Singhee, Amith. (Author), Rutenbar, Rob A. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Series:Lecture Notes in Electrical Engineering, 46
Subjects:
Electronic circuits.
Data structures (Computer science).
Computer system failures.
Circuits and Systems.
Data Structures.
System Performance and Evaluation.
Online Access:https://doi.org/10.1007/978-90-481-3100-6

Internet

https://doi.org/10.1007/978-90-481-3100-6

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