Statistical methods for reliability data /

Bibliographic Details
Main Author: Meeker, William Q. (Autor/a)
Other Authors: Escobar, Luis A. (Autor/a)
Format: Book
Language:English
Published: New York : J. Wiley & Sons, c1998.
Series:Wiley series in probality and statistics. Applied probability and statistics
Subjects:
Description
Physical Description:xxii, 680 páginas : ilustraciones.
ISBN:9780471143284
0471143286