A study of temperature measurement precision in debye-scherrer specimens during high temperature x-ray difraction measurement of thermal expansion

Detalles Bibliográficos
Autor principal: Merryman, R. G. (Autor, Autor/a)
Formato: Libro
Lenguaje:Undetermined
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245 1 0 |a A study of temperature measurement precision in debye-scherrer specimens during high temperature x-ray difraction measurement of thermal expansion 
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