Statistical analysis of measurement errors /

Bibliographic Details
Main Author: Jaech, John L. (Author, Autor/a)
Format: Book
Language:English
Published: New York, New York : J. Wiley, c1985.
Subjects:
Description
Item Description:An Exxon monagraph.
Physical Description:293 páginas ; 23 cm
Bibliography:Incluye bibliografias.
ISBN:0471827312