Nanometrology using the transmission electron microscope /

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Nanometrology using the transmission electron microscope /

Bibliographic Details
Main Author:	Stolojan, Vlad (Autor/a)
Format:	Book
Language:	English
Published:	San Rafael, CA : Morgan & Claypool Publishers, c2015.
Series:	IOP concise physics
Subjects:	NANOTECNOLOGIA NANOESTRUCTURAS > MEDICIONES MICROSCOPIOS ELECTRONICOS DE TRANSMISION NANOESTRUCTURAS
Online Access:	Ver documento en línea

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