Atomic scale characterization and first-principles studies of Si3N4 interfaces /
Format: | Book |
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Published: |
c2011.
|
Online Access: | Ver documento en línea |
ISBN: | 9781441978172 |
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Format: | Book |
---|---|
Published: |
c2011.
|
Online Access: | Ver documento en línea |
ISBN: | 9781441978172 |
---|