APA Citation

(2017). Electromigration inside logic cells: Modeling, analyzing and mitigating signal electromigration in nanoCMOS.

Chicago Style Citation

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. 2017.

MLA Citation

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. 2017.

Warning: These citations may not always be 100% accurate.