Advances in X-Ray Analysis / Edited by William M. Mueller ; sponsored by University Denver
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Formato: | Libro |
Lenguaje: | Undetermined |
Publicado: |
New York : Plenum Press
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Materias: |
LEADER | 00496nam a2200133Ia 4500 | ||
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008 | 250611s9999||||xx |||||||||||||| ||und|| | ||
040 | |a Sistema de Bibliotecas de la Universidad Nacional Autónoma de Nicaragua, UNAN-León | ||
082 | |a 620.112 D | ||
100 | |a Mueller, William M. | ||
245 | 0 | |a Advances in X-Ray Analysis / Edited by William M. Mueller ; sponsored by University Denver | |
260 | |a New York : Plenum Press | ||
300 | |a v.4 il. | ||
650 | |a 1.RAYOS X -APLICACIONES INDUSTRIALES | ||
999 | |c 3388 |