Advances in X-Ray analysis

Detalles Bibliográficos
Formato: Libro
Lenguaje:Undetermined
Publicado: US Plenum Press, New York 1970
LEADER 00689nam a2200121Ia 4500
008 240626s9999||||xx |||||||||||||| ||und||
040 |b En  |a Laboratorio de Física de Radiaciones y Metrología (LAFRAM) 
245 0 |a Advances in X-Ray analysis  
260 |a US  |b Plenum Press, New York   |c 1970 
300 |a v- 
500 |a Sin Especificar 
504 |a Contenido v.13: Proceedings of the Eighteenth anual conference on applications of X-Ray analysis held August 6-8, 1969; Volumen 14: Proceedings of the held annual conference on applications of X-Ray analysis h August 5-7, 1970; volumen 15: Proceedings of the twentieth annual conference on applications of X-Ray analysis held August 11-13, 1971 
999 |c 102992