Failure mechanisms in semiconductor devices /

Bibliographic Details
Main Author:	Amerasekera, E. A.
Format:	Book
Language:	English
Published:	New York : John Wiley & Sons, 1997.
Edition:	2 edición
Subjects:	Circuitos Componentes Matemática Control de calidad Semiconductores libros

Description
Physical Description:	345 páginas.
ISBN:	0471954829

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