RAPID EMBEDDED SYSTEM TESTING USING VERIFICATION PATTERNS.

Bibliographic Details
Main Author:	TSAI, WEI-TEK
Format:	Article
Language:	Spanish
Subjects:	PROGRAMAS DE COMPUTACION DESARROLLO DE PROGRAMAS CIRCUITOS INTEGRADOS COMPUTADORAS DIGITALES REGRESION NO LINEAL SISTEMAS ENCAJADOS Artículos de revista

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