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01501nam a22003615i 4500 |
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20201202093755.0 |
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cr nn 008mamaa |
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121025s2013 gw | s |||| 0|eng d |
| 020 |
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|a 9783642273810
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| 024 |
7 |
|
|a 10.1007/978-3-642-27381-0
|2 doi
|
| 040 |
|
|
|a Sistema de Bibliotecas del Tecnológico de Costa Rica
|
| 100 |
1 |
|
|a Hofmann, Siegfried.
|e author.
|
| 245 |
1 |
0 |
|a Auger- and X-Ray Photoelectron Spectroscopy in Materials Science :
|b A User-Oriented Guide /
|c by Siegfried Hofmann.
|
| 250 |
|
|
|a 1st ed. 2013.
|
| 260 |
# |
# |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2013.
|
| 300 |
|
|
|a XX, 528 p. :
|b online resource.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
|
|a Springer Series in Surface Sciences,
|v 49
|
| 505 |
0 |
|
|a Outline of the Technique/Brief Description -- Theoretical Background -- Instrumentation -- Practical Surface Analysis with AES -- Data Evaluation/Quantification -- Problem Solving with AES (Examples).
|
| 650 |
|
0 |
|a Solid state physics.
|
| 650 |
|
0 |
|a Spectroscopy.
|
| 650 |
|
0 |
|a Microscopy.
|
| 650 |
|
0 |
|a Materials—Surfaces.
|
| 650 |
|
0 |
|a Thin films.
|
| 650 |
1 |
4 |
|a Solid State Physics.
|
| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
|
| 650 |
2 |
4 |
|a Surfaces and Interfaces, Thin Films.
|
| 710 |
2 |
|
|a SpringerLink (Online service)
|
| 773 |
0 |
|
|t Springer eBooks
|
| 900 |
|
|
|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|