Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability /

Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Tehranipoor, Mohammad. (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Frontiers in Electronic Testing, 37
Subjects:
Electronic circuits.
Electronics.
Microelectronics.
Nanotechnology.
Quality control.
Reliability.
Industrial safety.
Electrical engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Quality Control, Reliability, Safety and Risk.
Electrical Engineering.

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