Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability /
Autor Corporativo: | SpringerLink (Online service) |
---|---|
Otros Autores: | Tehranipoor, Mohammad. (Editor ) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2008.
|
Edición: | 1st ed. 2008. |
Colección: | Frontiers in Electronic Testing,
37 |
Materias: |
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