Nanometer Technology Designs High-Quality Delay Tests /

Nanometer Technology Designs High-Quality Delay Tests /

Detalles Bibliográficos
Autor principal: Ahmed, Nisar. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Materias:
Electronic circuits.
Electronics.
Microelectronics.
Computer-aided engineering.
Nanotechnology.
Electrical engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Electrical Engineering.
Acceso en línea:https://doi.org/10.1007/978-0-387-75728-5

Internet

https://doi.org/10.1007/978-0-387-75728-5

Sistema de Bibliotecas del Tecnológico de Costa Rica

Detalle de Existencias desde Sistema de Bibliotecas del Tecnológico de Costa Rica
Copia Disponible

Ejemplares similares