Nanometer Technology Designs High-Quality Delay Tests /
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| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2008.
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| Edición: | 1st ed. 2008. |
| Materias: | |
| Acceso en línea: | https://doi.org/10.1007/978-0-387-75728-5 |
Tabla de Contenidos:
- Introduction to path delay and transition delay fault models and test methods
- At-speed test challenges for nanometer technology designs
- Low-cost tester friendly design-for-test techniques
- Improving test quality of current at-speed test methods
- Functionally untestable fault list generation and avoidance
- Timing-based ATPG for screening small delay faults
- Faster-than-at-speed test considering IR-drop effects
- IR-drop tolerant at-speed test pattern generation and application.