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01835nam a22003855i 4500 |
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978-0-387-75728-5 |
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20191027123102.0 |
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cr nn 008mamaa |
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100715s2008 xxu| s |||| 0|eng d |
| 020 |
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|a 9780387757285
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7 |
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|a 10.1007/978-0-387-75728-5
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Ahmed, Nisar.
|e author.
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|a Nanometer Technology Designs
|b High-Quality Delay Tests /
|c by Nisar Ahmed.
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| 250 |
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|a 1st ed. 2008.
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| 260 |
# |
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|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2008.
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| 300 |
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|a XVIII, 281 p. 140 illus.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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|a Introduction to path delay and transition delay fault models and test methods -- At-speed test challenges for nanometer technology designs -- Low-cost tester friendly design-for-test techniques -- Improving test quality of current at-speed test methods -- Functionally untestable fault list generation and avoidance -- Timing-based ATPG for screening small delay faults -- Faster-than-at-speed test considering IR-drop effects -- IR-drop tolerant at-speed test pattern generation and application.
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|a Electronic circuits.
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| 650 |
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|a Electronics.
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| 650 |
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|a Microelectronics.
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| 650 |
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|a Computer-aided engineering.
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| 650 |
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|a Nanotechnology.
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| 650 |
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|a Electrical engineering.
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| 650 |
1 |
4 |
|a Circuits and Systems.
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| 650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
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| 650 |
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4 |
|a Computer-Aided Engineering (CAD, CAE) and Design.
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| 650 |
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|a Nanotechnology.
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| 650 |
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4 |
|a Electrical Engineering.
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| 710 |
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|a SpringerLink (Online service)
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| 773 |
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|t Springer eBooks
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| 856 |
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|u https://doi.org/10.1007/978-0-387-75728-5
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