Nanometer Technology Designs High-Quality Delay Tests /

Nanometer Technology Designs High-Quality Delay Tests /

Detalles Bibliográficos
Autor principal: Ahmed, Nisar. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Materias:
Electronic circuits.
Electronics.
Microelectronics.
Computer-aided engineering.
Nanotechnology.
Electrical engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Electrical Engineering.
Acceso en línea:https://doi.org/10.1007/978-0-387-75728-5
Descripción
Descripción Física:XVIII, 281 p. 140 illus. online resource.
ISBN:9780387757285

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