Nanometer Technology Designs High-Quality Delay Tests /

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Nanometer Technology Designs High-Quality Delay Tests /

Detalles Bibliográficos
Autor principal:	Ahmed, Nisar. (Autor)
Autor Corporativo:	SpringerLink (Online service)
Formato:	eBook
Lenguaje:	English
Publicado:	New York, NY : Springer US : Imprint: Springer, 2008.
Edición:	1st ed. 2008.
Materias:	Electronic circuits. Electronics. Microelectronics. Computer-aided engineering. Nanotechnology. Electrical engineering. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Computer-Aided Engineering (CAD, CAE) and Design. Electrical Engineering.
Acceso en línea:	https://doi.org/10.1007/978-0-387-75728-5

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