Power-Aware Testing and Test Strategies for Low Power Devices /

Power-Aware Testing and Test Strategies for Low Power Devices /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Girard, Patrick. (Editor), Nicolici, Nicola. (Editor), Wen, Xiaoqing. (Editor)
Format: eBook
Language:English
Published: New York, NY : Springer US : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Subjects:
Electronic circuits.
Computer-aided engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.

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