Power-Aware Testing and Test Strategies for Low Power Devices /

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Power-Aware Testing and Test Strategies for Low Power Devices /

Detalles Bibliográficos
Autor Corporativo:	SpringerLink (Online service)
Otros Autores:	Girard, Patrick. (Editor ), Nicolici, Nicola. (Editor ), Wen, Xiaoqing. (Editor )
Formato:	eBook
Lenguaje:	English
Publicado:	New York, NY : Springer US : Imprint: Springer, 2010.
Edición:	1st ed. 2010.
Materias:	Electronic circuits. Computer-aided engineering. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design.

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