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01640nam a22003255i 4500 |
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20210922135532.0 |
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cr nn 008mamaa |
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110414s2010 xxu| s |||| 0|eng d |
| 020 |
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|a 9781441909282
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| 024 |
7 |
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|a 10.1007/978-1-4419-0928-2
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 245 |
1 |
0 |
|a Power-Aware Testing and Test Strategies for Low Power Devices /
|c edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
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| 250 |
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|a 1st ed. 2010.
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| 260 |
# |
# |
|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2010.
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| 300 |
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|a XXI, 363 p. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 505 |
0 |
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|a Fundamentals of VLSI Testing -- Power Issues During Test -- Low-Power Test Pattern Generation -- Power-Aware Design-for-Test -- Power-Aware Test Data Compression and BIST -- Power-Aware System-Level Test Planning -- Low-Power Design Techniques and Test Implications -- Test Strategies for Multivoltage Designs -- Test Strategies for Gated Clock Designs -- Test of Power Management Structures -- EDA Solution for Power-Aware Design-for-Test.
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| 650 |
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0 |
|a Electronic circuits.
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| 650 |
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0 |
|a Computer-aided engineering.
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| 650 |
1 |
4 |
|a Circuits and Systems.
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| 650 |
2 |
4 |
|a Computer-Aided Engineering (CAD, CAE) and Design.
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| 700 |
1 |
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|a Girard, Patrick.
|e editor.
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| 700 |
1 |
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|a Nicolici, Nicola.
|e editor.
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| 700 |
1 |
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|a Wen, Xiaoqing.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|