Power-Aware Testing and Test Strategies for Low Power Devices /

Power-Aware Testing and Test Strategies for Low Power Devices /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Girard, Patrick. (Editor ), Nicolici, Nicola. (Editor ), Wen, Xiaoqing. (Editor )
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer US : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Materias:
Electronic circuits.
Computer-aided engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Tabla de Contenidos:
  • Fundamentals of VLSI Testing
  • Power Issues During Test
  • Low-Power Test Pattern Generation
  • Power-Aware Design-for-Test
  • Power-Aware Test Data Compression and BIST
  • Power-Aware System-Level Test Planning
  • Low-Power Design Techniques and Test Implications
  • Test Strategies for Multivoltage Designs
  • Test Strategies for Gated Clock Designs
  • Test of Power Management Structures
  • EDA Solution for Power-Aware Design-for-Test.

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