Power-Aware Testing and Test Strategies for Low Power Devices /
| Corporate Author: | |
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| Other Authors: | , , |
| Format: | eBook |
| Language: | English |
| Published: |
New York, NY :
Springer US : Imprint: Springer,
2010.
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| Edition: | 1st ed. 2010. |
| Subjects: |
Table of Contents:
- Fundamentals of VLSI Testing
- Power Issues During Test
- Low-Power Test Pattern Generation
- Power-Aware Design-for-Test
- Power-Aware Test Data Compression and BIST
- Power-Aware System-Level Test Planning
- Low-Power Design Techniques and Test Implications
- Test Strategies for Multivoltage Designs
- Test Strategies for Gated Clock Designs
- Test of Power Management Structures
- EDA Solution for Power-Aware Design-for-Test.