Fundamentals of Nanoscaled Field Effect Transistors /

Detalles Bibliográficos
Autor principal: Chaudhry, Amit. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: New York, NY : Springer New York : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Materias:
Tabla de Contenidos:
  • Scaling of a MOS Transistor
  • Nanoscale Effects- Gate Oxide Leakage Currents
  • Nanoscale Effects- Inversion Layer Quantization
  • Dielectrics for Nanoelectronics
  • Germanium Technology
  • Biaxial s-Si Technology
  • Uniaxial s-Si Technology
  • Alternate MOS Structures
  • Graphene Technology.