Emerging Technologies and Circuits /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Amara, Amara. (Editor ), Ea, Thomas. (Editor ), Belleville, Marc. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:Lecture Notes in Electrical Engineering, 66
Materias:
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020 |a 9789048193790 
024 7 |a 10.1007/978-90-481-9379-0  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
245 1 0 |a Emerging Technologies and Circuits /  |c edited by Amara Amara, Thomas Ea, Marc Belleville. 
250 |a 1st ed. 2010. 
260 # # |a Dordrecht :  |b Springer Netherlands :  |b Imprint: Springer,  |c 2010. 
300 |a X, 266 p. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Lecture Notes in Electrical Engineering,  |v 66 
505 0 |a Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscape -- EMERGING TECHNOLOGY AND DEVICES -- New State Variable Opportunities Beyond CMOS: A System Perspective -- A Simple Compact Model to Analyze the Impact of Ballistic and Quasi-Ballistic Transport on Ring Oscillator Performance -- ADVANCED DEVICES AND CIRUITS -- Low-Voltage Scaled 6T FinFET SRAM Cells -- Independent-Double-Gate FINFET SRAM Cell for Drastic Leakage Current Reduction -- Metal Gate Effects on a 32 nm Metal Gate Resistor -- RELIABILITY AND SEU -- Threshold Voltage Shift Instability Induced by Plasma Charging Damage in MOSFETS with High-K Dielectric -- Analysis of SI Substrate Damage Induced by Inductively Coupled Plasma Reactor with Various Superposed Bias Frequencies -- POWER, TIMING AND VARIABILITY -- CMOS SOI Technology for WPAN: Application to 60 GHZ LNA -- SRAM Memory Cell Leakage Reduction Design Techniques in 65 nm Low Power PD-SOI CMOS -- Resilient Circuits for Dynamic Variation Tolerance -- Process Variability-Induced Timing Failures - A Challenge in Nanometer CMOS Low-Power Design -- How Does Inverse Temperature Dependence Affect Timing Sign-Off -- CMOS Logic Gates Leakage Modeling Under Statistical Process Variations -- On-Chip Circuit Technique for Measuring Jitter and Skew with Picosecond Resolution -- ANALOG AND MIXED SIGNAL -- DC-DC Converter Technologies for On-Chip Distributed Power Supply Systems - 3D Stacking and Hybrid Operation -- Sampled Analog Signal Processing: From Software-Defined to Software Radio. 
650 0 |a Electronic circuits. 
650 0 |a Nanotechnology. 
650 0 |a Computer memory systems. 
650 1 4 |a Circuits and Systems. 
650 2 4 |a Nanotechnology. 
650 2 4 |a Memory Structures. 
700 1 |a Amara, Amara.  |e editor. 
700 1 |a Ea, Thomas.  |e editor. 
700 1 |a Belleville, Marc.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks