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03572nam a22004335i 4500 |
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20210521134226.0 |
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cr nn 008mamaa |
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100301s2010 gw | s |||| 0|eng d |
| 020 |
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|a 9783642006234
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| 024 |
7 |
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|a 10.1007/978-3-642-00623-4
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 245 |
1 |
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|a Ion Beams in Nanoscience and Technology /
|c edited by Ragnar Hellborg, Harry J. Whitlow, Yanwen Zhang.
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| 250 |
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|a 1st ed. 2010.
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| 260 |
# |
# |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2010.
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| 300 |
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|a XXIII, 457 p. 6 illus. in color. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Particle Acceleration and Detection,
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| 505 |
0 |
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|a Trends in nanoscience and technology -- Nanoscale Engineering in the Biosciences -- High Speed Electronics -- Surface Modification Using Reactive Landing of Mass-Selected Ions -- Basic ion-matter interactions in nanometre scale materials -- Basics of Ion Scattering in Nanoscale Materials -- Box 1: Stopping of Ions in Nanomaterials -- Box 2: Sputtering -- Box 3: Ion Ranges -- Computer Simulation Methods for Defect Configurations and Nanoscale Structures -- Characterising Nanoscale Crystal Perfection by Crystal Mapping -- Box 4: Interatomic Potential -- Ion beam characterisation of nanoscale materials -- Medium Energy Ion Scattering for Near Surface Structure and Depth Profiling -- Box 5: Surface Crystallography Terminology -- Thin Film Characterisation Using MeV Ion Beams -- Nanoscale Materials Defect Characterisation -- Box 6: Nanoscale Defects -- Box 7: Diagnostic Ion Beam Luminescence -- Nanomaterials Science with Radioactive Ion Beams -- Nanoscale materials processing with ion beams -- Nanocluster and Nanovoid Formation by Ion Implantation -- Plasma Etching and Integration with Nanoprocessing -- Focused Ion Beam Machining and Deposition -- Box 8: Sample Preparation for Transmission Electron Microscopy Using a Focused Ion Beam -- Box 9: Integrated Circuit Chip Modification Using Focused Ion Beams -- Proton Beam Writing: A New 3D Nanolithographic Technique -- Box 10: Proton Beam Writing of Optical Structures -- Box 11: Tissue Engineering and Bioscience Methods Using Proton Beam Writing -- Box 12: Stamps for Nanoimprint Lithography -- Box 13: Silicon Micro/Nano-Fabrication Using Proton Beam Writing and Electrochemical Etching -- Nanoscale Materials Modification for Device Applications -- Luminescence, Ion Implantation, and Nanoparticles -- Micro- and Nanoengineering with Ion Tracks -- Equipment and practice -- Ion Accelerators for Nanoscience -- Focusing keV and MeV Ion Beams -- Ion Spectrometers and Detectors -- Electronics for Application of Ion Beams in Nanoscience.
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| 650 |
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0 |
|a Nanotechnology.
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| 650 |
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0 |
|a Physical measurements.
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| 650 |
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0 |
|a Measurement .
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| 650 |
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0 |
|a Particle acceleration.
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| 650 |
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0 |
|a Solid state physics.
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| 650 |
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0 |
|a Spectroscopy.
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| 650 |
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0 |
|a Microscopy.
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| 650 |
1 |
4 |
|a Nanotechnology.
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| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
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| 650 |
2 |
4 |
|a Particle Acceleration and Detection, Beam Physics.
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| 650 |
2 |
4 |
|a Solid State Physics.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 700 |
1 |
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|a Hellborg, Ragnar.
|e editor.
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| 700 |
1 |
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|a Whitlow, Harry J.
|e editor.
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| 700 |
1 |
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|a Zhang, Yanwen.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|