Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Cullis, A.G. (Editor ), Midgley, P.A. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Springer Proceedings in Physics, 120
Materias:
Materials science.
Solid state physics.
Spectroscopy.
Microscopy.
Physical measurements.
Measurement   .
Electronics.
Microelectronics.
Materials Science, general.
Solid State Physics.
Spectroscopy and Microscopy.
Measurement Science and Instrumentation.
Electronics and Microelectronics, Instrumentation.
Acceso en línea:https://doi.org/10.1007/978-1-4020-8615-1

Internet

https://doi.org/10.1007/978-1-4020-8615-1

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